Back to DE:Sign Projects

DI-GATE-V

Highly Optimized Open-Source RISC-V Processors for Universal Applications

DI-GATE-V develops highly optimized open-source RISC-V processor cores for general-purpose applications. The open RISC-V architecture forms the basis for sovereign and transparent processor development.

Objectives and Approach

The project develops a new RISC-V processor family for edge and embedded applications and releases it fully as open source. Accompanying tools are developed to enable straightforward adaptation, optimization, and synthesis of the processors for various use cases and hardware platforms.

Innovations and Perspectives

FPGA synthesis tools are often bulky and accessible only after paid registration. Modern open-source alternatives reduce entry barriers for young talent and improve the flexibility, interoperability, and efficiency of design chains.

Project Coordinator

Project Partners

This project is funded by the German Federal Ministry for Research, Technology and Space (BMFTR) as part of the Design Initiative Microelectronics.

Events

© IEEE PRIME Conference
Sep 20, 2026 - Sep 23, 2026
Berlin

PRIME 2026

21st International Conference on PhD Research in Microelectronics and Electronics

More information here
© Fraunhofer IIS
Jun 29, 2026 - Jul 2, 2026
Dresden

SMACD 2026

International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design

More information here
© IdeenExpo
Jun 20, 2026 - Jun 28, 2026
Hannover

IdeenExpo 2026

Europas größtes Jugendevent für Technik und Naturwissenschaften

More information here
© Informationstechnische Gesellschaft ITG VDE e.V.
Jun 19, 2026
Dresden

bits, bonding, bassline

Festival der Elektronik

More information here
May 19, 2026 - May 20, 2026
Baden-Baden

microTEC Clusterkonferenz 2026

More information here
May 6, 2026 - May 7, 2026
Dresden

Chipdesign Germany Forum 2026

More information here
© DATE Conference
Apr 20, 2026 - Apr 22, 2026
Verona

DATE 26 conference

Design, Automation and Test in Europe Conference

More information here