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DI-SIGN-HEP

Trusted Hardware for Industrial Data Processing

DI-SIGN-HEP develops trusted hardware solutions for secure and reliable industrial data processing. Tamper-resistant hardware is a cornerstone of digital sovereignty in industrial applications.

Objectives and Approach

The project develops a manageable and commercially easy-to-integrate hardware security module (HSM) for industry. The aim is to increase the security of cryptographic keys and reduce dependence on vendor-specific hardware solutions. Integration into the Caliptra framework and development of tools for verification, side-channel hardening, and fault injection are planned.

Innovations and Perspectives

The project partners combine further development of existing approaches with development of new ones to advance open hardware security. Results are intended for use within the consortium and in industry, helping to build a sustainable ecosystem for secure chip design in Germany and Europe and to strengthen European sovereignty in critical infrastructure.

Project Coordinator

Project Partners

This project is funded by the German Federal Ministry for Research, Technology and Space (BMFTR) as part of the Design Initiative Microelectronics.

Events

© IEEE PRIME Conference
Sep 20, 2026 - Sep 23, 2026
Berlin

PRIME 2026

21st International Conference on PhD Research in Microelectronics and Electronics

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© Fraunhofer IIS
Jun 29, 2026 - Jul 2, 2026
Dresden

SMACD 2026

International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design

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© IdeenExpo
Jun 20, 2026 - Jun 28, 2026
Hannover

IdeenExpo 2026

Europas größtes Jugendevent für Technik und Naturwissenschaften

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© Informationstechnische Gesellschaft ITG VDE e.V.
Jun 19, 2026
Dresden

bits, bonding, bassline

Festival der Elektronik

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May 19, 2026 - May 20, 2026
Baden-Baden

microTEC Clusterkonferenz 2026

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May 6, 2026 - May 7, 2026
Dresden

Chipdesign Germany Forum 2026

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© DATE Conference
Apr 20, 2026 - Apr 22, 2026
Verona

DATE 26 conference

Design, Automation and Test in Europe Conference

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